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Advanced Characterization Techniques for Thin Film Solar Cells
Angielski
755 b
30 dni na zwrot towaru
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179.90
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The book focuses on advanced characterization methods for thin-fi lm solar cells that have proven their relevance both for academic and corporate photovoltaic§research and development. After an introduction to thin-fi lm photovoltaics, renowned experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are§used for ab-initio calculations of relevant semiconductors and for device simulations in one, two, and three dimensions.§§Building on a proven concept, this new edition also covers transient optoelectronic methods, absorption and photocurrent spectroscopy, in-situ realtime characterization of thin-fi lm growth, as well as simulations based on molecular dynamics.
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